This course is designed to explore methods of applying statistical process control and statistical quality control to semiconductor manufacturing processes. Students will be required to complete a design project.
Requisites
Prerequisites:
ISYE 3770 (Min. Grade: D) or MATH 3770 (Min. Grade: D) or CEE 3770 (Min. Grade: D)
Restrictions:
Cannot be enrolled in one of the following Levels: Undergraduate Semester (US)
Must be enrolled in one of the following Campuses: Georgia Tech-Atlanta * (A)
All Instructors
GPA: 3.63Most Common: A (64.4%)
This total includes data from semesters with unknown instructors